Test Platform Speeds Manufacturing Of NB-IoT Chips

Huawei NB-IoT Chipsets Supported by Anritsu Wireless Test Solution

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Anritsu announced that its high-speed MT8870A Universal Wireless Test Set provides support for the Hi2110 and Hi2115 NB-IoT chipsets designed for IoT use cases, helping IoT module and device vendors to improve product quality and manufacturing efficiency.

Huawei endorses MT8870A wireless test platform for RF calibration and validation tests

“Anritsu’s wireless test set offers IoT module and device vendors a comprehensive solution for the RF Calibration and Verification testing of embedded wireless technology” said Hirokazu Hamada, president of Anritsu’s Measurement Business Group. “Hisilicon chipsets and automated test software, combined with MT8870A RF test solutions will result in one of the industry’s shortest test times and provide an attractive total cost of ownership proposition to the highly competitive wireless IoT market.”

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“Anritsu has established the ability to thoroughly calibrate and validate our chipsets in both R&D and manufacturing environment, meeting our requirements for accuracy and repeatability.” said Huawei, “Their equipment is already being successfully introduced by some of our leading customers to meet manufacturing requirement and availability expectations. The NB-IoT device RF Cal and testing in manufacture can be better ensured by involving Anritsu MT8870A wireless tester.

More information:

https://www.anritsu.com/en-AU/test-measurement/news/news-releases/2018/2018-03-12-au-10

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