Test and Measurement Solutions Address Explosive Data Growth, PAM4, Standards Competition in Data Center Computing


At DesignCon 2018, test solutions provider Keysight Technologies will exhibit its most advanced design and test solution for solving today’s most difficult high-speed digital measurement challenges. These will include PAM4 solutions for testing TX/RX designs,  Signal Integrity Simulation and Data Analytics Software, and more.

Keysight Technologies will exhibit its latest high-speed digital solutions at DesignCon 2018.

Keysight will demonstrate the following new solutions:

  • PAM4 solutions for testing TX/RX designs — comprehensive test solution, featuring the new N1076B 16/32/64 GBaud Electrical Clock Recovery Solution, for analysis of PAM4 designs defined in emerging standards such as IEEE 802.3bs/cd and OIF-CEI-56G/112G
  • Signal Integrity Simulation and Data Analytics Software — Keysight EEsof ADS 2017 signal integrity channel simulation combined with powerful N8844A Data Analytics Software to quickly and easily compare simulation results with measured data
  • Signal Integrity — new Physical Layer Test System (PLTS) 2017, including the addition of PAM4 eye diagram testing, introduces significant breakthrough capabilities with regards to manufacturing test of high-speed interconnects
  • Signal Integrity — new S93011A PNA-TDR software offering digital signal integrity engineers a one-box solution for characterizing high-speed serial interconnects
  • Power Integrity — Keysight EEsof ADS 2017, including the new ElectroThermal simulator for PIPro, provides a complete solution for the power integrity (PI) workflow, such as DC IR Drop, DC electro-thermal, and PDN impedance analysis, with a special bill of materials optimization for decaps

Compliance test solutions will include DDR4 / LPDDR4 memory test and validation, PCI Express Gen4 TX/RX test, fully automated USB Type-C interface testing and MIPI physical layer testing





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