- High-speed signal jitter components get separated into random and deterministic components.
- Test engineers can now gain more insight into the individual jitter components for accurate measurements and debugging.
With the increase of data rates and a decrease in voltage swings, the digital interfaces jitters occur in signal intervals, which causes signal test failures. Increasingly, engineers require tools that accurately characterize the signal jitters and breaks it down into its individual components.
To solve this problem, Rohde & Schwarz, a supplier of test and measurements solutions, has developed a powerful tool that analyses the individual jitter components. Therefore, this provides in-depth knowledge about debugging high-speed signals, estimating bit error rate and view spectral and peak periodic jitter data. Through this, test electronics and design engineers can greatly benefit from.
New jitter analysis method
The new R&S RTO / RTP jitter analysis option presents an analytic approach to separate the individual jitter components such as random jitter and deterministic jitter, which includes data-dependent and periodic jitter. This approach is based on a parametric signal model that fully characterises the behaviour of the transmission link under test.
In contrast to conventional methods that reduce data to a set of Time Interval Error measurements, this jitter model includes complete waveform characteristic of the test signal and presents a consistent measurement data for relatively short signal sequences. Along with this, any previously unavailable information such as the step response or a distinction between vertical and horizontal periodic jitter is available as well.
“We are proud to introduce an advanced method, and first really new approach to improve jitter separation for oscilloscopes in almost 20 years,” said Josef Wolf, Senior Vice President and Head of the Rohde & Schwarz oscilloscope division. “With our new advanced jitter option, we help engineers to get additional insight into the jitter characteristics of their signal that were not previously available.”
This new jitter separation option expands the present signal integrity debugging functions that are used by engineers. This new development complements the industry’s only integrated time-domain reflectometry (TDR) / time-domain transmissometry (TDT) measurement and real-time de-embedding capabilities in a single oscilloscope.