Accurately Measuring Noise In New Electronic Devices For IoT, 5G

Collaboration delivers greater functionality and flexibility for researchers that need to accurately measure noise in new electronic devices for use in IoT, 5G


A new milestone in low-frequency noise measurement has been announced by Keysight Technologies, which the company developed through its work with research centres in Europe, Middle East, Africa and India (EMEAI). This development will help designers measure noise more accurately in a broad range of electronic devices for use in IoT and 5G.

Keysight said it has now reached a new milestone in low-frequency noise measurements using the new Advanced Low-Frequency Noise Analyzer (A-LFNA) and WaferPro Express software. 

Keysight EDA’s E4727A is a high-performance noise analyzer designed to make fast, accurate and repeatable low-frequency noise (LFN) measurements.

The company said that it’s collaboration with different research centers has increased the analyser’s versatility in flicker-noise and random telegraph noise measurements. It also helped strengthen the use of the analyzer for devices used in industrial electronics and in 5G and IoT-based devices.

“Low-frequency noise significantly impacts performance of electronic devices such as sensors and memories. The new advanced low-frequency noise analyzer (A-LFNA) functionality enables designers to transform their low-frequency noise measurements into mathematical models of new devices”, the company noted in the announcement.

In reaching the milestone, Keysight worked with leading research centers in Europe, Middle East, Africa and India (EMEAI), such as Sweden’s Chalmers University, Germany’s Fraunhofer EMFT, Belgium’s IMEC, and France’s LAAS-CNRS.

According to researchers at Fraunhofer EMFT, Germany: “By controlling A-LFNA with WaferPro Express, we significantly improved our ability to set up sequences to characterize our extremely low-noise devices, while also gaining the flexibility to drive the whole measurement system effortlessly. The system can mathematically post-process our raw results in an automated way, allowing us to very quickly get insight into the noise figure improvement of our newly developed devices.”

Researchers at Chalmers University at Sweden noted that they have also found success with the new A-LFNA solution. Using the analyzer, they were able to significantly improve the throughput of their high-quality, flicker noise measurements.

Press release:

More information: Advanced Low-Frequency Noise Analyzer (A-LFNA) and WaferPro Express software


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